Denver X- ray Conference Program Monday Morning Workshops 9: 0. Noon. Basic to Intermediate XRD I Lasalle COrganizer & Instructors: M. Rodriguez, Sandia National Laboratory, Albuquerque, NM, USA, marodri@sandia. T. Blanton, ICDD, Newtown Square, PA, USA, tblanton@icdd. S. T. Misture, New York State College of Ceramics at Alfred University, Alfred, NY, USA, misture@alfred. Buy Texas Instruments TI-89 Titanium Graphing Calculator: Everything Else - Amazon.com FREE DELIVERY possible on eligible purchases. Characteristics Physical properties. Plutonium, like most metals, has a bright silvery appearance at first, much like nickel, but it oxidizes very quickly to a dull. View and Download Texas Instruments TI-84 PLUS - Graphing Calculator manual book online. TI-84 PLUS - Graphing Calculator Calculator pdf manual download. Low prices for Yokohama S.Drive tires at our online discount tire store in Canada or the United States. 100% fitment guarantee! Click to view PDF : 2016 Denver X-ray Conference Program Quick Links: Program at a glance. Monday Morning Workshops. Monday Afternoon Workshops. Rulers Index Ta-Ti Ta Mok, original name Ung Choeun, also called Chhit Choeun, Ek Choeun, etc. 1926, Brakeab village, Takeo province, southern Cambodia - d. TI-84 Plus TI-84 Plus Silver Edition Guidebook. Important Information Important Information Important Information Important Information Texas. This workshop will discuss the use of XRD for standard qualitative analysis and will detail progressively more challenging means of XRD characterization including: quantitative analysis, profile fitting, lattice parameter refinement, crystallite size and microstrain determination, texture analysis, and structure refinement (Rietveld). Additionally, some discussion shall be dedicated to characterization of nanomaterials and glasses via pair distribution function analysis, as well as thin film techniques such as grazing incidence XRD and X- ray reflectivity (XRR). The workshop is intended to be a survey for the new user of XRD regarding what experiments can be performed and why one would wish to pursue such measurements. Diffraction Contrast Imaging Madison. Organizer & Instructors: B. Brown, Los Alamos National Laboratory, Los Alamos, NM, bpatterson@lanl. J. S. Park, Argonne National Laboratory, Argonne, IL, parkjs@aps. E. Lauridsen, Xnovo Technology, K. In situ measurements of polycrystalline materials, their starting morphologies, and their crystallographic response to stimuli (stress, thermal, radiation) can all be understood. The availability of these techniques in both synchrotron and laboratory based sources opens up a wide variety of X- ray techniques and allows researchers to customize the measurements for the materials of interest. Basic XRF Lasalle AOrganizer & Instructors: A. Name: Size: Date: Rating: Description: folder : Up to TI-83/84 Plus BASIC Math Programs: advderiv.zip: 8k: 06-05-18: Advanced Derivative Function It will calculate F. Hearst Magazines and Hearst Digital Media are divisions of Hearst Communications, Inc. ClassZone Book Finder. Follow these simple steps to find online resources for your book. R. Drews, Ford Motor Company, Dearborn, MI, adrews@ford. G. J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, havrilla@lanl. This workshop provides a basic introduction to the principles of XRF specifically aimed at those new to the field. In the first half, there will be a general overview of the XRF technique, including a discussion of the basic principles. The emphasis in the first half will be on understanding the underlying physical phenomena, how the technique is applied, optimization of the signal, and approaches to quantitative analysis. In the second half of the workshop, examples of real- world applications will be presented to illustrate some of the challenges and opportunities that the analyst may face. This half will describe a variety of specimen formats and demonstrate the flexibility of the XRF technique. Synergies between Laboratory and Synchrotron X- ray Methods Lasalle BOrganizer & Instructors: G. Seidler, University of Washington, Seattle, WA, USA, seidler@uw. U. E. A. Fittschen, Washington State University, Pullman, WA, USAJ. Reid, Canadian Light Source Inc., Saskatoon, SK, Canada, joel. S. Lapidus, Argonne National Laboratory, Argonne, IL, USAM. Bedzyk, Northwestern University, Evanston, IL, USA Multiple speakers will address important industrial and basic research X- ray applications that span laboratory and synchrotron facilities. This will include XAFS, very high- resolution XRF for speciation, XRF imaging, powder XRD, and the much- improved integration of lab and synchrotron studies thanks to flexible rapid access scheduling, mail- in services, and on- site consultation. Fundamentals of X- ray Absorption Spectroscopy Executive Forum Amphitheater. Organizer & Instructors: G. Segre, Illinois Institute of Technology Physics Department, Chicago, IL, USA, bunker@iit. This workshop will provide an introductory overview of X- ray Absorption Fine Structure Spectroscopy for the study of the structures of materials. Applications to materials research will be described, and there will be an opportunity for Q& A. The workshop will conclude with an overview of some potential pitfalls and how to avoid them. Monday Afternoon Workshops 1: 3. Basic to Intermediate XRD II Lasalle C. Continued from Monday morning. Rietveld for Beginners - Introduction to Rietveld fitting with GSAS- II Executive Forum Amphitheater. Organizers & Instructors: B. Von Dreele, Argonne National Laboratory, Argonne, IL, USA, brian. This workshop will introduce basic concepts in Rietveld fitting and show how armed with an approximate crystal structure and a diffractogram, fitting is done with GSAS- II. Attendees will use their own laptops to fit an example set of data. Prerequisite: bring a laptop (Windows, Linux or Mac) with GSAS- II already installed (see http: //tinyurl. Energy Dispersive XRFLasalle AOrganizer & Instructors: R. Phillips, Thermo Fisher Scientific, West Palm Beach, FL, USA, rich. K. Charron, Access Business Group, Ada, MI, USA, kem. W. Watson, Thermo Fisher Scientific, Mountain View, CA, USA, wayne. This workshop is designed to provide a discussion of the theoretical and practical aspects of EDXRF spectrometry providing a comprehensive review of the basic fundamentals for both the beginner and experienced X- ray spectroscopist. Topics to be covered include excitation systems; detectors; components and their relation to EDXRF applicability; ease of use; rapid qualitative analysis and material screening; calibration techniques for quantitative analysis; standard- less analysis; sensitivity of EDXRF for a wide variety of elements in various matrices as well as sample preparation. We discuss some real- life application examples where EDXRF is being used to solve complex analytical problems. The major emphases will be on the applicability of EDXRF and the optimal protocol for generating and reporting of reliable experimental results. Trace Analysis. Lasalle BOrganizers & Instructors: C. Wobrauschek, Vienna University of Technology, Vienna, Austria, streli@ati. K. Tsuji, Osaka City University, Osaka, Japan, tsuji@a- chem. N. Kawahara, Rigaku Corporation, Osaka, Japan, kawahara@rigaku. Both beginners and experienced X- ray physicists should gain information by attending the Trace Analysis workshop. Presentations of most modern techniques and instrumentation for trace element analysis using EDXRS will be given. Physical methods to improve minimum detection limits in XRF by background reduction will be discussed; special emphasis will be on synchrotron radiation as excitation source. Introduction to total reflection XRF (TXRF) and actual instrumentation will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range down to light elements (eg. Applications from interesting scientific fields as environment, microelectronics, forensic, and life science will show the successful use of the various XRF spectrometric techniques. The possibilities of trace analysis using wavelength dispersive XRF will also be covered, showing the benefits and limitations of the technique. A comparison of achievable detection limits with the various techniques on some specific samples will be discussed. XRD Poster Session – Monday Evening, Michigan Room The Monday Evening XRD Poster Session will be held 5: 0. Michigan Room. in conjunction with a Wine & Cheese Reception. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN, USA and I. C. Noyan, Columbia University, New York, NY, USA*Signifies Presenting Author, when noted D- 6 X- ray Diffraction Study of Nanocellulose II Produced from the Amazonian Seed Coconut (Tucum. Manzato, IFAM, Manaus, AM, Brazil. S. M. Simonsen, OSU, Corvallis, OR, USAWINNER! D- 8 X- ray Analysis for Quantifying Various Components in Poly(vinyl chloride) Plastics. P. Smith, Arkema Inc., King of Prussia, PA, USAWITHDRAWN D- 1. Structural Investigation of Chemical Ordering in the (Ga. Znx)(N1- x. Ox) Visible- light Photocatalyst by Neutron and X- ray Diffraction. D. Skrabalak, Indiana University, Bloomington, IN, USA D- 1. Phase Equilibria in the Co- Fe- Si Ternary System using Synchrotron Powder Diffraction. J. Nash, Illinois Institute of Technology, Chicago, IL, USA D- 1. What Is the Origin of a Series of Low Angle XRD Peaks Which Appear Following Thermal Cycling of a Gadolinium - Doped Ceria Film – Formation of a Superlattice or Surface Contamination? Y. Zon*, Weizmann Institute of Science, Rehovot, Israel. V. Shelukhin, Tel- Aviv University, Tel- Aviv, Israel D- 1. Operando XRD- DRIFT: Catalyst Characterization by Fisher- Tropsch Process for Clean Fuel Production. C. Fontugne, Thermo Scientific, Artenry, France. V. Lemaitre, IFP, Lyon, France. WITHDRAWN D- 2. 2 Crystallographic Studies of Solvent Sorption in a Flexible 2. D Layer Spin Crossover Coordination Polymer. Y.- C. Lee, National Synchrotron Radiation Research Center, Hsinchu, Taiwan. C.- C. Wang, Soochow University, Taipei, Taiwan D- 2. Analysis of Steels by Handheld XRDG. M. Hansford, University of Leicester, Leicester, UK D- 2. Synchrotron Powder Diffraction Simplified: The High- Resolution Diffractometer 1. BM at the Advanced Photon Source. L. Toby, Argonne National Laboratory, Argonne, IL, USAWITHDRAWN D- 2. Stacking Faults and Phase Transformations Study in Ball Milled Co. X Crx(x = 0, 2. 0, 5. Alloys. S. Louidi, University 2. Ao. Sunol, Universitat de Girona, Girona, Spain D- 2. The Mineralogy, Nucleation and Growth of Freshwater Ferromanganese Nodules. S. Xu*, NASA Astrobiology Institute, University of Wisconsin –Madison, Madison, WI, USA D- 2. The Influence of the Sintering Temperature and Synthesis Method on the Structural Properties of Doped Perovskites Like: La. Sr. 0. 2. 5Cr. 0. Fe. 0. 5- 0. 3. O3 (LSCF) And Ba. Zr. 0. 7. Pr. 0. 1. Y0. 2. O3 (BZPY)K. Segre, Illinois Institute of Technology, Chicago, IL, USA D- 3. Extended Range Ultra Small- Angle, Small- Angle, and Wide- Angle X- ray Scattering Facility for Materials Development. J. Andrews, APS, Argonne National Laboratory, Lemont, IL, USAG. Muralidharan, Oak Ridge National Laboratory, Oak Ridge, TN, USAF. Allen, National Institute of Standards and Technology, Gaithersburg, MD, USAD- 3.
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